Temperature dependent DC characterization of...

IOP Conference Series Materials Science and Engineering 2015 / 02 Vol. 73

Temperature dependent DC characterization of InAlN/(AlN)/GaN HEMT for improved reliability

Takhar, K, Gomes, U P, Ranjan, K, Rathi, S, Biswas, D
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Volume:
73
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/73/1/012001
Date:
February, 2015
File:
PDF, 713 KB
english, 2015
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