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[IEEE 2015 International Conference on Emerging Research in Electronics, Computer Science and Technology (ICERECT) - Mandya, India (2015.12.17-2015.12.19)] 2015 International Conference on Emerging Research in Electronics, Computer Science and Technology (ICERECT) - Fault coverage analysis using fault model and functional testing for DPM reduction
Thilak, K R, Gayathri, S.Year:
2015
Language:
english
DOI:
10.1109/erect.2015.7498991
File:
PDF, 605 KB
english, 2015