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SPIE Proceedings [SPIE Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation - Beijing, China (Friday 13 October 2006)] Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation - Software design of missile integrated test system
Dai, Jing, Fang, Jiancheng, Wang, Zhongyu, Zhang, Ping, Li, Xingshan, Liao, Canxing, Wang, ZongliVolume:
6358
Year:
2006
Language:
english
DOI:
10.1117/12.718066
File:
PDF, 275 KB
english, 2006