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[ACM Press the 53rd Annual Design Automation Conference - Austin, Texas (2016.06.05-2016.06.09)] Proceedings of the 53rd Annual Design Automation Conference on - DAC '16 - Invited - Cross-layer modeling and optimization for electromigration induced reliability
Kim, Taeyoung, Sun, Zeyu, Cook, Chase, Zhao, Hengyang, Li, Ruiwen, Wong, Daniel, Tan, Sheldon X.-D.Year:
2016
Language:
english
DOI:
10.1145/2897937.2905010
File:
PDF, 370 KB
english, 2016