Modification of intrinsic defects in IZO/IGZO thin films for reliable bilayer thin film transistors
Tiwari, Nidhi, Chauhan, Ram Narayan, Liu, Po-Tsun, Shieh, Han-Ping D.Volume:
6
Year:
2016
Language:
english
Journal:
RSC Adv.
DOI:
10.1039/C6RA13208A
File:
PDF, 3.23 MB
english, 2016