Time-of-flight secondary ion mass spectroscopy with bismuth primary ions of clean and air-exposed surfaces of tellurium
Berchenko, Nicolas, Trzyna, Malgorzata, Rading, Derk, Cebulski, JozefVolume:
20
Year:
2014
Language:
english
Journal:
European Journal of Mass Spectrometry
DOI:
10.1255/ejms.1297
File:
PDF, 2.13 MB
english, 2014