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Impact of interface trap density at metal/SiN x /n + MOS capacitor in multilayered Si solar cells
Sahoo, Santosh K., Sopori, Bhushan L., Misra, Durga, Rivero, Rene, Ravindra, Nuggehalli M.Volume:
3
Language:
english
Journal:
Emerging Materials Research
DOI:
10.1680/emr.13.00048
Date:
April, 2014
File:
PDF, 480 KB
english, 2014