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Microstructure in shear band observed by microfocus X-ray computed tomography
Oda, M., Takemura, T., Takahashi, M.Volume:
54
Language:
english
Journal:
Géotechnique
DOI:
10.1680/geot.2004.54.8.539
Date:
October, 2004
File:
PDF, 406 KB
english, 2004