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Enhanced Depth Profiling of Perovskite Oxide: Low Defect Levels Induced in SrTiO 3 by Argon Cluster Sputtering
Ridier, Karl, Aureau, Damien, Bérini, Bruno, Dumont, Yves, Keller, Niels, Vigneron, Jackie, Etcheberry, Arnaud, Fouchet, ArnaudLanguage:
english
Journal:
The Journal of Physical Chemistry C
DOI:
10.1021/acs.jpcc.6b04007
Date:
September, 2016
File:
PDF, 2.07 MB
english, 2016