A structural and compositional analysis of interfaces in...

Journal of Materials Science 1984 / 11 Vol. 19; Iss. 11

A structural and compositional analysis of interfaces in ZnSe0.94S0.06layers grown on to GaAs by OMCVD

M. A. Penenzhik, L. P. Berdnikova, A. D. Virnik
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Volume:
19
Language:
english
Pages:
6
DOI:
10.1007/bf00552285
Date:
November, 1984
File:
PDF, 244 KB
english, 1984
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