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Slow-crack propagations through bimaterial interfaces studied by scanning electron microscopy
C. A. Stassinakis, P. S. Theocaris, V. KytopoulosVolume:
21
Language:
english
Pages:
6
DOI:
10.1007/bf00553246
Date:
April, 1986
File:
PDF, 1.70 MB
english, 1986