Analysis of grain structure evolution based on optical...

Analysis of grain structure evolution based on optical measurements of mc Si wafers

Strauch, Theresa, Demant, Matthias, Krenckel, Patricia, Riepe, Stephan, Rein, Stefan
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Volume:
454
Language:
english
Journal:
Journal of Crystal Growth
DOI:
10.1016/j.jcrysgro.2016.09.009
Date:
November, 2016
File:
PDF, 4.12 MB
english, 2016
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