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Analysis of grain structure evolution based on optical measurements of mc Si wafers
Strauch, Theresa, Demant, Matthias, Krenckel, Patricia, Riepe, Stephan, Rein, StefanVolume:
454
Language:
english
Journal:
Journal of Crystal Growth
DOI:
10.1016/j.jcrysgro.2016.09.009
Date:
November, 2016
File:
PDF, 4.12 MB
english, 2016