[IEEE 2016 IEEE Electrical Insulation Conference (EIC) - Montreal, QC, Canada (2016.6.19-2016.6.22)] 2016 IEEE Electrical Insulation Conference (EIC) - Electrical diagnostics of high voltage devices via high resolution near field analysis
Gaborit, Gwenael, Gillette, Laurane, Revillod, Guillaume, Dahdah, Jean, Duvillaret, Lionel, Volat, Christophe, Pons, Christian, Bic, Emmanuel, Giannini, Laura, Dumont, ErwanYear:
2016
Language:
english
DOI:
10.1109/EIC.2016.7548663
File:
PDF, 578 KB
english, 2016