Partial discharge occurrence induced by crack defect on GIS...

IEEE Transactions on Dielectrics and Electrical Insulation 2016 / 8 Vol. 23; Iss. 4

Partial discharge occurrence induced by crack defect on GIS insulator operated at 1100 kV

Ji, Hong-xin, Li, Cheng-rong, Ma, Guo-ming, Pang, Zhi-kai, Tang, Zhi-guo, Wen, Hao, Cui, Bo-yuan
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Volume:
23
Language:
english
Journal:
IEEE Transactions on Dielectrics and Electrical Insulation
DOI:
10.1109/TDEI.2016.7556501
Date:
August, 2016
File:
PDF, 2.04 MB
english, 2016
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