[IEEE 2016 IEEE European Test Symposium (ETS) - Amsterdam, Netherlands (2016.5.23-2016.5.27)] 2016 21th IEEE European Test Symposium (ETS) - IJTAG supported 3D DFT using chiplet-footprints for testing multi-chips active interposer system
Durupt, Jean, Vivet, Pascal, Schloeffel, JuergenYear:
2016
Language:
english
DOI:
10.1109/ets.2016.7519310
File:
PDF, 2.46 MB
english, 2016