[IEEE 2016 IEEE European Test Symposium (ETS) - Amsterdam,...

  • Main
  • [IEEE 2016 IEEE European Test Symposium...

[IEEE 2016 IEEE European Test Symposium (ETS) - Amsterdam, Netherlands (2016.5.23-2016.5.27)] 2016 21th IEEE European Test Symposium (ETS) - IJTAG supported 3D DFT using chiplet-footprints for testing multi-chips active interposer system

Durupt, Jean, Vivet, Pascal, Schloeffel, Juergen
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2016
Language:
english
DOI:
10.1109/ets.2016.7519310
File:
PDF, 2.46 MB
english, 2016
Conversion to is in progress
Conversion to is failed