[IEEE 2016 IEEE European Test Symposium (ETS) - Amsterdam, Netherlands (2016.5.23-2016.5.27)] 2016 21th IEEE European Test Symposium (ETS) - Transistor stuck-on fault detection tests for digital CMOS circuits
Lin, Xijiang, Reddy, Sudhakar M., Rajski, JanuszYear:
2016
Language:
english
DOI:
10.1109/ets.2016.7519329
File:
PDF, 242 KB
english, 2016