A New Approach to Determine Parameter Sensitivities of...

A New Approach to Determine Parameter Sensitivities of Transfer Lines

Ho, Y. C., Eyler, M. A., Chien, T. T.
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Volume:
29
Language:
english
Journal:
Management Science
DOI:
10.1287/mnsc.29.6.700
Date:
June, 1983
File:
PDF, 813 KB
english, 1983
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