[IEEE 1975 IEEE International Symposium on Electromagnetic Compatibility - San Antonio, Texas (1975.10.7-1975.10.9)] 1975 IEEE International Symposium on Electromagnetic Compatibility - Combined Electromagnetic Compatibility and Thermal Analysis and Design
Osburn, John. D., Ritenour, Thurman J.Year:
1975
Language:
english
DOI:
10.1109/ISEMC.1975.7567891
File:
PDF, 153 KB
english, 1975