[IEEE 2016 74th Annual Device Research Conference (DRC) -...

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[IEEE 2016 74th Annual Device Research Conference (DRC) - Newark, DE, USA (2016.6.19-2016.6.22)] 2016 74th Annual Device Research Conference (DRC) - Density scaling beyond the FinFET: Architecture considerations for gate-all-around CMOS

Guillorn, Michael A., Loubet, Nicolas J., Yeung, Chun-Wing, Chao, Robin, Muthinti, Raja, Demarest, James, Robison, Robert, Miao, Xin, Zhang, Jingyun, Hook, Terry, Oldiges, Phil, Yamashita, Tenko
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Year:
2016
Language:
english
DOI:
10.1109/drc.2016.7548399
File:
PDF, 97 KB
english, 2016
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