[IEEE 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2016.5.31-2016.6.3)] 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) - 3Di DC-DC Buck Micro Converter with TSVs, Grind Side Inductors, and Deep Trench Decoupling Capacitors in 32nm SOI CMOS
Safran, John, Rangan, Giri N. K., Vanukuru, Venkata Nr, Torgal, Sandeep, Chaturvedi, Vikram, P., Sarath Lal K., Butt, Shahid, Maier, Gary, Cestero, Alberto, Tran-Quinn, Thuy, Nag, Joyeeta, Rosenblatt,Year:
2016
Language:
english
DOI:
10.1109/ectc.2016.324
File:
PDF, 1.21 MB
english, 2016