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Capacitance Relaxation Method for Detecting Surface States and Bulk Traps at Semiconductor-liquid Junctions
Kobayashi, Kenkichiro, Takata, Masasuke, Okamoto, Shoichi, Sukigara, MitsunoriVolume:
15
Language:
english
Journal:
Chemistry Letters
DOI:
10.1246/cl.1986.1507
Date:
September, 1986
File:
PDF, 8.14 MB
english, 1986