[IEEE 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2016.5.31-2016.6.3)] 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) - The Electrical Reliability of Silver Wire Bonds under High Temperature Storage
Mayer, Michael, Xu, Di Erick, Ratcliffe, KieranYear:
2016
Language:
english
DOI:
10.1109/ectc.2016.347
File:
PDF, 368 KB
english, 2016