Conductance-to-Current-Ratio-Based Parameter Extraction in...

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IEEE Transactions on Electron Devices 2016

Conductance-to-Current-Ratio-Based Parameter Extraction in MOS Leakage Current Models

Ortiz-Conde, Adelmo, Sucre-Gonzalez, Andrea, Torres-Torres, Reydezel, Molina, Joel, Murphy-Arteaga, Roberto S., Garcia-Sanchez, Francisco J.
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Year:
2016
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2016.2597964
File:
PDF, 1.82 MB
english, 2016
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