[131] Experimental study of the short-circuit robustness of...

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Microelectronics Reliability 2016 / 9

[131] Experimental study of the short-circuit robustness of 600V E-mode GaN transistors

Landel, M., Gautier, C., Labrousse, D., Lefebvre, S.
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Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.07.042
Date:
September, 2016
File:
PDF, 3.37 MB
english, 2016
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