[ACM Press the 31st IEEE/ACM International Conference - Singapore, Singapore (2016.09.03-2016.09.07)] Proceedings of the 31st IEEE/ACM International Conference on Automated Software Engineering - ASE 2016 - Applying combinatorial test data generation to big data applications
Li, Nan, Lei, Yu, Khan, Haider Riaz, Liu, Jingshu, Guo, YunYear:
2016
Language:
english
DOI:
10.1145/2970276.2970325
File:
PDF, 407 KB
english, 2016