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ESR Study of Active Oxygen Radicals from Photoexcited Semiconductors Using the Spin-Trapping Technique
Noda, Hiroyuki, Oikawa, Kazuo, Kamada, HitoshiVolume:
65
Journal:
Bulletin of the Chemical Society of Japan
DOI:
10.1246/bcsj.65.2505
Date:
September, 1992
File:
PDF, 677 KB
1992