Ion-selective Imaging by Atomic Force Microscopy with a...

Ion-selective Imaging by Atomic Force Microscopy with a Crown-ether-modified Tip

Kado, Shinpei, Yano, Hitoshi, Nakahara, Yoshio, Kimura, Keiichi
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Volume:
38
Language:
english
Journal:
Chemistry Letters
DOI:
10.1246/cl.2009.58
Date:
January, 2009
File:
PDF, 373 KB
english, 2009
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