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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Optics and Photonics for Information Processing X - Focal length evaluation by inverse ray-tracing Ronchi test

Iftekharuddin, Khan M., Awwal, Abdul A. S., García Vázquez, Mireya, Matin, Mohammad A., Juarez-Salazar, Rigoberto, Diaz-Gonzalez, Gerardo, Robledo-Sánchez, Carlos
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Volume:
9970
Year:
2016
Language:
english
DOI:
10.1117/12.2238306
File:
PDF, 661 KB
english, 2016
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