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X-Ray Photoelectron Spectroscopic Study of Alternately Layered Zirconium and Hafnium Phosphonate Thin Films on Silicon Substrates
Umemura, Yasushi, Yamagishi, Akihiko, Tanaka, Ken-ichiVolume:
70
Journal:
Bulletin of the Chemical Society of Japan
DOI:
10.1246/bcsj.70.2399
Date:
October, 1997
File:
PDF, 743 KB
1997