Characterization of Atomically Smooth Al Films by Transmission Electron Microscopy and Atomic Force Microscopy
Higo, Morihide, Lu, X., Mazur, U., Hipps, K. W.Volume:
26
Journal:
Chemistry Letters
DOI:
10.1246/cl.1997.709
Date:
August, 1997
File:
PDF, 1.07 MB
1997