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Rapid and Accurate C-V Measurements
Kim, Ji-Hong, Shrestha, Pragya R., Campbell, Jason P., Ryan, Jason T., Nminibapiel, David, Kopanski, Joseph J., Cheung, Kin P.Year:
2016
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2016.2598855
File:
PDF, 1.15 MB
english, 2016