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A Comparative Study of NBTI and PBTI Using Different Experimental Techniques
Mukhopadhyay, Subhadeep, Goel, Nilesh, Mahapatra, SouvikYear:
2016
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2016.2599854
File:
PDF, 1.78 MB
english, 2016