![](/img/cover-not-exists.png)
[IEEE 2016 74th Annual Device Research Conference (DRC) - Newark, DE, USA (2016.6.19-2016.6.22)] 2016 74th Annual Device Research Conference (DRC) - A compact model for tunnel FET for all operation regimes including trap assisted tunneling
Sajjad, Redwan N., Antoniadis, DimitriYear:
2016
Language:
english
DOI:
10.1109/drc.2016.7548414
File:
PDF, 2.59 MB
english, 2016