[IEEE 2016 74th Annual Device Research Conference (DRC) -...

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[IEEE 2016 74th Annual Device Research Conference (DRC) - Newark, DE, USA (2016.6.19-2016.6.22)] 2016 74th Annual Device Research Conference (DRC) - A compact model for tunnel FET for all operation regimes including trap assisted tunneling

Sajjad, Redwan N., Antoniadis, Dimitri
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Year:
2016
Language:
english
DOI:
10.1109/drc.2016.7548414
File:
PDF, 2.59 MB
english, 2016
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