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Microelectronics Reliability 2016 / 9

Magnetic field and current density imaging using off-line lock-in analysis

Kögel, M., Altmann, F., Tismer, S., Brand, S.
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Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.07.083
Date:
September, 2016
File:
PDF, 1.52 MB
english, 2016
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