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Evolution study of the ElectroMagnetic Interference for RF LDMOS in series chopper application after thermal accelerated tests
Belaïd, M.A., Kaouach, H., Slama, J.B.H.Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.07.109
Date:
September, 2016
File:
PDF, 1.79 MB
english, 2016