[IEEE 2016 IEEE/MTT-S International Microwave Symposium (IMS) - San Francisco, CA (2016.5.22-2016.5.27)] 2016 IEEE MTT-S International Microwave Symposium (IMS) - A novel approach to microwave circuit large-signal variability analysis through efficient device sensitivity-based physical modeling
Guerrieri, Simona Donati, Bonani, Fabrizio, Ghione, GiovanniYear:
2016
Language:
english
DOI:
10.1109/mwsym.2016.7540392
File:
PDF, 242 KB
english, 2016