A new specimen preparation technique for the scanning...

Géotechnique 1975 / 03 Vol. 25; Iss. 1

A new specimen preparation technique for the scanning electron microscope

Wong, K. Y., Tovey, N. K.
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Volume:
25
Language:
english
Journal:
Géotechnique
DOI:
10.1680/geot.1975.25.1.142
Date:
March, 1975
File:
PDF, 1005 KB
english, 1975
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