[IEEE 2016 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM) - Nanjing, China (2016.5.16-2016.5.18)] 2016 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM) - Design and on-wafer measurements of 60GHz MMIC LNA with on-chip active biasing
Zhang, Dawei, Ma, Haihong, Yu, Hongxi, Li, JunYear:
2016
Language:
english
DOI:
10.1109/iwem.2016.7504894
File:
PDF, 507 KB
english, 2016