Path Clustering for Test Pattern Reduction of...

Journal of Electronic Testing 2016 / 10 Vol. 32; Iss. 5

Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay Testing

Shintani, Michihiro, Uezono, Takumi, Hatayama, Kazumi, Masu, Kazuya, Sato, Takashi
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Volume:
32
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-016-5614-0
Date:
October, 2016
File:
PDF, 1.13 MB
english, 2016
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