NEGATIVE BIAS TEMPERATURE INSTABILITY IN TIN/HF-SILICATE...

International Journal of High Speed Electronics and Systems 2007 / 03 Vol. 17; Iss. 1

NEGATIVE BIAS TEMPERATURE INSTABILITY IN TIN/HF-SILICATE BASED GATE STACKS

CHOWDHURY, N. A., MISRA, D., RAHIM, N.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
17
Language:
english
Journal:
International Journal of High Speed Electronics and Systems
DOI:
10.1142/s0129156407004345
Date:
March, 2007
File:
PDF, 1.16 MB
english, 2007
Conversion to is in progress
Conversion to is failed