[IEEE 2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - Las Vegas, NV, USA (2016.5.31-2016.6.3)] 2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - Thermal raman and IR measurement of heterogeneous integration stacks
Harris, T. Robert, Pavlidis, Georges, Wyers, Eric J., Marshal Newberry, D., Graham, Samuel, Franzon, Paul, Davis, W. RhettYear:
2016
Language:
english
DOI:
10.1109/ITHERM.2016.7517727
File:
PDF, 681 KB
english, 2016