[IEEE 2016 35th Chinese Control Conference (CCC) - Chengdu,...

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[IEEE 2016 35th Chinese Control Conference (CCC) - Chengdu, China (2016.7.27-2016.7.29)] 2016 35th Chinese Control Conference (CCC) - A fault feature reduction method based on rough set attribute reduction and principal component analysis

Huang, Qiang, Wang, Jian, Su, Haixia, Yang, Lu, Ding, Zhaoping, Zhang, Guigang
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Year:
2016
DOI:
10.1109/ChiCC.2016.7554399
File:
PDF, 317 KB
2016
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