[IEEE 2016 74th Annual Device Research Conference (DRC) -...

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[IEEE 2016 74th Annual Device Research Conference (DRC) - Newark, DE, USA (2016.6.19-2016.6.22)] 2016 74th Annual Device Research Conference (DRC) - Investigation of thermal effects in β-Ga2O3 MOSFET using pulsed IV

Moser, Neil A., Crespo, Antonio, Tetlak, Stephen E., Green, Andrew J., Chabak, Kelson D., Jessen, Gregg H.
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Year:
2016
Language:
english
DOI:
10.1109/DRC.2016.7548419
File:
PDF, 289 KB
english, 2016
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