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[IEEE 2016 IEEE International Vacuum Electronics Conference (IVEC) - Monterey, CA, USA (2016.4.19-2016.4.21)] 2016 IEEE International Vacuum Electronics Conference (IVEC) - Effects of thermal processing and machining on emission surface quality of nano-composite scandate tungsten cathodes
Busbaher, Daniel, Tarter, James, Chubaruk, Ruslan, Gamzina, Diana, Soekland, Gordon E., Luhmann, Neville C.Year:
2016
Language:
english
DOI:
10.1109/IVEC.2016.7561809
File:
PDF, 785 KB
english, 2016