Kinetics of ion-beam mixing at Ti-Si interfaces

Journal of Materials Science: Materials in Electronics 1990 / 08 Vol. 1; Iss. 2

Kinetics of ion-beam mixing at Ti-Si interfaces

I. J. Jabr, N. S. Saleh, K. A. Al-Saleh
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Volume:
1
Language:
english
Pages:
5
DOI:
10.1007/bf00694916
Date:
August, 1990
File:
PDF, 545 KB
english, 1990
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