Dynamic-Bias S-Parameters: A New Measurement Technique for...

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IEEE Transactions on Microwave Theory and Techniques 2016

Dynamic-Bias S-Parameters: A New Measurement Technique for Microwave Transistors

Avolio, Gustavo, Raffo, Antonio, Vadala, Valeria, Vannini, Giorgio, Schreurs, Dominique M. M.-P.
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Year:
2016
Language:
english
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/TMTT.2016.2608344
File:
PDF, 2.14 MB
english, 2016
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