[IEEE 2016 IEEE International Conference on Advanced...

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[IEEE 2016 IEEE International Conference on Advanced Intelligent Mechatronics (AIM) - Banff, AB, Canada (2016.7.12-2016.7.15)] 2016 IEEE International Conference on Advanced Intelligent Mechatronics (AIM) - Integrating principal component analysis and optimal histogram estimation for Bayesian control loop diagnosis

Zhu, Wenbing, Yang, Zijiang, Tang, Meishuang, Zhou, Sun, Yao, Bin, Ji, Guoli
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Year:
2016
Language:
english
DOI:
10.1109/AIM.2016.7576918
File:
PDF, 287 KB
english, 2016
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