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[IEEE 2016 IEEE International Conference on Dielectrics (ICD) - Montpellier, France (2016.7.3-2016.7.7)] 2016 IEEE International Conference on Dielectrics (ICD) - Grains size effect on charge trapping in electron irradiated ceramics; stability and discharge study using a special arrangement in a Scanning Electron Microscope
Mekni, O., Goeuriot, D., Joao Sao, S., Meunier, C., Damamme, G., Mekni, O., Raouadi, K.Year:
2016
Language:
english
DOI:
10.1109/ICD.2016.7547563
File:
PDF, 583 KB
english, 2016