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[IEEE 2016 IEEE International Conference on Software Testing, Verification and Validation (ICST) - Chicago, IL, USA (2016.4.11-2016.4.15)] 2016 IEEE International Conference on Software Testing, Verification and Validation (ICST) - MuVM: Higher Order Mutation Analysis Virtual Machine for C
Tokumoto, Susumu, Yoshida, Hiroaki, Sakamoto, Kazunori, Honiden, ShinichiYear:
2016
Language:
english
DOI:
10.1109/ICST.2016.18
File:
PDF, 267 KB
english, 2016