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[IEEE 2016 IEEE/MTT-S International Microwave Symposium (IMS) - San Francisco, CA (2016.5.22-2016.5.27)] 2016 IEEE MTT-S International Microwave Symposium (IMS) - Characterization of broadband low-NEP SiGe square-law detectors for mm-wave passive imaging
Malotaux, E.S., Spirito, M.Year:
2016
Language:
english
DOI:
10.1109/mwsym.2016.7539967
File:
PDF, 387 KB
english, 2016